Spectra | UV

NET PHYSICAL SCIENCE

S. No	PART 'B' (CORE)
6	Electronics and Experimental Methods: Semiconductor devices (diodes, junctions, transistors, field effect devices, homo- and hetero-junction devices), device structure, device characteristics, frequency dependence and applications. Opto-electronic devices (solar cells, photo-detectors, LEDs). Operational amplifiers and their applications. Digital techniques and applications (registers, counters, comparators and similar circuits). A/D and D/A converters. Microprocessor and microcontroller basics.Data interpretation and analysis. Precision and accuracy. Error analysis, propagation of errors. Least squares fitting.

S. No

PART 'B' (CORE)

Electronics and Experimental Methods: Semiconductor devices (diodes, junctions, transistors, field effect devices, homo- and hetero-junction devices), device structure, device characteristics, frequency dependence and applications. Opto-electronic devices (solar cells, photo-detectors, LEDs). Operational amplifiers and their applications. Digital techniques and applications (registers, counters, comparators and similar circuits). A/D and D/A converters. Microprocessor and microcontroller basics.Data interpretation and analysis. Precision and accuracy. Error analysis, propagation of errors. Least squares fitting.

S. No	PART 'C' (ADVANCED)
6	Electronics and Experimental Methods: Linear and nonlinear curve fitting, chi-square test. Transducers (temperature, pressure/vacuum, magnetic fields, vibration, optical, and particle detectors). Measurement and control. Signal conditioning and recovery. Impedance matching, amplification (Op-amp based, instrumentation amp, feedback), filtering and noise reduction, shielding and grounding. Fourier transforms, lock-in detector, box-car integrator, modulation techniques.High frequency devices (including generators and detectors).

S. No

PART 'C' (ADVANCED)

Electronics and Experimental Methods: Linear and nonlinear curve fitting, chi-square test. Transducers (temperature, pressure/vacuum, magnetic fields, vibration, optical, and particle detectors). Measurement and control. Signal conditioning and recovery. Impedance matching, amplification (Op-amp based, instrumentation amp, feedback), filtering and noise reduction, shielding and grounding. Fourier transforms, lock-in detector, box-car integrator, modulation techniques.High frequency devices (including generators and detectors).